منابع مشابه
Continuum models of focused electron beam induced processing
Focused electron beam induced processing (FEBIP) is a suite of direct-write, high resolution techniques that enable fabrication and editing of nanostructured materials inside scanning electron microscopes and other focused electron beam (FEB) systems. Here we detail continuum techniques that are used to model FEBIP, and release software that can be used to simulate a wide range of processes rep...
متن کاملChitin and Cellulose Processing in Low-Temperature Electron Beam Plasma.
Polysaccharide processing by means of low-temperature Electron Beam Plasma (EBP) is a promising alternative to the time-consuming and environmentally hazardous chemical hydrolysis in oligosaccharide production. The present paper considers mechanisms of the EBP-stimulated destruction of crab shell chitin, cellulose sulfate, and microcrystalline cellulose, as well as characterization of the produ...
متن کاملMeasurements of Photon Beam Flattening Filter Using an Anisotropic Analytical Algorithm and Electron Beam Employing Electron Monte Carlo
Introduction: This study aimed to report the measurement of photon and electron beams to configure the Analytical Anisotropic Algorithm and Electron Monte Carlo used in clinical treatment. Material and Methods: All measurements were performed in a large water phantom using a 3-dimensional scanning system (PTW, Germany). ...
متن کاملPulsed Electron-Beam Heating
A pulsed, 20 kv electron beam is focussed upon a vapor-deposited thermocouple, and the resulting temperature vs. time response is studied. The experimental data show much scatter, but are consistent with the theoretical prediction that the characteristic thermal response time T is proportional to d , where d is the beam diameter at the thermocouple. From these data, for the soft-glass substrate...
متن کاملConvergent beam electron diffraction
In convergent-beam electron diffraction (CBED) a highly convergent electron beam is focussed on to a small (~< 50 nm) area of the sample. Instead of the diffraction spots that are obtained in the back focal plane of the objective lens with parallel illumination in conventional selected-area electron diffraction, CBED produces discs of intensity. The point group can be determined uniquely from t...
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ژورنال
عنوان ژورنال: SHINKU
سال: 1991
ISSN: 0559-8516,1880-9413
DOI: 10.3131/jvsj.34.699